Instrumentation

High Resolution TEM/STEM Microscope JEOl JEM F200 CFEG TEM/STEM (200, 80KV),
with a TEM point resolution of 0.19 nm and STEM-HAADF 0.14 nm.
The microscope is equipped with:

  • Cold Field Emission Gun
  • Oxford Instruments Aztec Energy EDS Analysis System & Software
    (X-Max 65T with an 65 mm2 detector)
  • GΑΤΑΝ RIO CMOS bottom camera for TEM bright field and dark field imaging

Implemented under the  EYDEP. REGION OF CENTRAL MACEDONIA, Axis: Ax01
“Strengthening research, technological development and innovation”
“TRANSMISSION-SCANNING/TRANSMISSION ELECTRON MICROSCOPE
WITH FIELD EMISSION GUN ELECTRON SOURCE” (2018-2020)
High Resoloution Transmission Electron Microscope JEOL 2011 (200KV),
with a point resolution of 0.194 nm.
The microscope is equipped with:

  • EMSIS’ XAROSA 20 mega pixel, bottom-mounted CMOS TEM camera & RADIUS software
    Implemented under the Action “Reinforcement of the Research and Innovation Infrastructure”, supported by the Operational Programme “Competitiveness, Entrepreneurship and Innovation” (NSRF 2014-2020) and co-financed by Greece and the European Union (European Regional Development Fund).
  • SPININGSTAR P020 device, for the precession and tilting of the electron beam (Nanomegas) accompanied with the necessary software
  • Oxford Instruments Aztec Energy EDS Analysis System & Software (X-Max 65T with an 65 mm2 detector)
High Resolution Transmission Electron Microscope JEOL 2000FX (200KV),
with point resolution of 0.28 nmThe microscope is equipped with:

  • KeenView G2 TEM camera system (Olympus Soft Imaging Solutions)
Conventional Transmission Electron Microscope JEOL JEM-1010 (40-100KV),
with a resolution 0.5 nm
The microscope is equipped with:

  • Gatan compact tv camera (Model 696)
Scanning Electron Microscope JEOL JSM-6390LV (0.5-30 KV),
with a resolution of 10nm.
The microscope is equipped with:

  • Oxford EDS-WDS Analyzer and INCA Software (x-act)
Metallographic Microscope Axiolab Zeiss with micro – hardness tester Anton Paar

 

Specimen Preparation Equipment

Precision Ion Polishing System Gatan (Model 691) Grinding/polishing system, Allied MultiPrep, Allied High Tech Dimple Grinder Gatan (Model 656)
Leica Ultracut UCT Ultramicrotome Buehler Isomet 2000 Precision Saw SBT Slow-speed diamond wheel saw (Model 650)
High-Temperature Furnace, Nabertherm LHT 04/18 Planetary ball mill Fritsch Pulverisette 6 GRINDOSONIC MK5 Industrial
Hot Isostatic Press
  • Fully organized sample preparation laboratory
  • Computer cluster 88 nodes with 2 GB RAM per node
  • Computer cluster 32 nodes with 2 GB RAM per node
  • 3 x HP servers (2x Intel Xeon Quad, 24 GB RAM)
  • Access to the national grid infrastucture HELLASGRID.
  • Access to the Centre de Ressources Informatiques de Haute-Normadie at Rouen France.
  • Access to the Research Center for Scientific Simulations which is housed at the University of Ioannina.