Materials & Methods

Materials

  • Polycrystalline Silicon
  • Cubic & Hexagonal Symmetry Metals
  • Magnetic Materials
  • Ceramics
  • Amorphous Metal Glasses
  • Glasses and Glass-Ceramic Materials for Vitrification and Waste Management
  • Multilayer Silicon Structures
  • Low Dimensional III-V Semiconductors (Quantum Wells, Nanowires, Quantum Dots)

 

Methods

  • Conventional Transmission Electron Microscopy (CTEM) combined with Selected Area Electron Diffraction (SAED) providing information on the overall structural quality, defect content and the orientation relationship of epitaxial structures
  • High Resolution TEM (HRTEM) for the local atomic arrangement of interfacial and defect structures
  • Local atomic chemistry of nanostructures idenitified by High Angle Annular Dark Field (HAADF) imaging, Energy Dispersive X-ray Spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS)
  • Topological analysis for a priori characterization of line and extended defects
  • Quantitative HRTEM (qHRTEM) image processing techniques (Geometrical Phase Analysis, peak finding and projection method)
  • Large scale energetic calculations of atomic structures with empirical potentials (Molecular Dynamics)
  • Structural and optoelectronic properties of semiconductors based on first principles calculations (Density Functional Theory, DFT)
  • Utilization of the “Vitrification” for the stabilization-solidification of inorganic toxic wastes